Error Characterization and Coding Schemes for Flash Memories

Conference paper

Eitan Yaakobi, Paul H. Siegel, Steven Swanson, Jack Wolf, Laura Grupp, Jing Ma
IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), Miami, Florida, USA, pp. 1-5

Cite

APA Click to copy
Yaakobi, E., Siegel, P. H., Swanson, S., Wolf, J., Grupp, L., & Ma, J. Error Characterization and Coding Schemes for Flash Memories. In IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010) (pp. 1–5). Miami, Florida, USA.

Chicago/Turabian Click to copy
Yaakobi, Eitan, Paul H. Siegel, Steven Swanson, Jack Wolf, Laura Grupp, and Jing Ma. “Error Characterization and Coding Schemes for Flash Memories.” In IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), 1–5. Miami, Florida, USA, n.d.

MLA Click to copy
Yaakobi, Eitan, et al. “Error Characterization and Coding Schemes for Flash Memories.” IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), pp. 1–5.

BibTeX Click to copy

@inproceedings{yaakobi-a,
  title = {Error Characterization and Coding Schemes for Flash Memories},
  address = {Miami, Florida, USA},
  pages = {1-5},
  author = {Yaakobi, Eitan and Siegel, Paul H. and Swanson, Steven and Wolf, Jack and Grupp, Laura and Ma, Jing},
  booktitle = {IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010)}
}